| 전자부품 데이터시트 검색엔진 |
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AD1877 데이터시트(PDF) 2 Page - Analog Devices |
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AD1877 데이터시트(HTML) 2 Page - Analog Devices |
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2 / 18 page ![]() AD1877–SPECIFICATIONS REV. A –2– TEST CONDITIONS UNLESS OTHERWISE NOTED Supply Voltages 5.0 V Ambient Temperature 25 °C Input Clock (FCLKIN) [256 × FS] 12.288 MHz Input Signal 991.768 Hz –0.5 dB Full Scale Measurement Bandwidth 23.2 Hz to 19.998 kHz Load Capacitance on Digital Outputs 50 pF Input Voltage HI (VIH) 2.4 V Input Voltage LO (VIL) 0.8 V Master Mode, Data I 2S-Justified (Refer to Figure 14). Device Under Test (DUT) bypassed and decoupled as shown in Figure 3. DUT is antialiased and ac coupled as shown in Figure 2. DUT is calibrated. Values in bold typeface are tested, all others are guaranteed but not tested. ANALOG PERFORMANCE Min Typ Max Unit Resolution 16 Bits Dynamic Range (20 Hz to 20 kHz, –60 dB Input) Without A-Weight Filter 87 92 dB With A-Weight Filter 90 94 dB Signal to (THD + Noise) 86.5 90 dB Signal to THD 92 94 dB Analog Inputs Single-Ended Input Range ( ± Full Scale)* VREF – 1.55 VREF VREF + 1.55 V Input Impedance at Each Input Pin 32 k Ω VREF 2.05 2.25 2.55 V DC Accuracy Gain Error ±0.5 2.5 % Interchannel Gain Mismatch 0.01 dB Gain Drift 115 ppm/ °C Midscale Offset Error (After Calibration) ±3 20 LSBs Midscale Drift 15 ppm/ °C Crosstalk (EIAJ Method) –90 –99 dB *VIN p-p = VREF × 1.333. |
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