| 전자부품 데이터시트 검색엔진 |
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ADG704 데이터시트(PDF) 7 Page - Analog Devices |
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ADG704 데이터시트(HTML) 7 Page - Analog Devices |
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7 / 8 page ![]() ADG704 –7– REV. A 0.1 F VDD VS SD VDD GND RL 300 CL 35pF VOUT 50% 50% 90% 90% VIN VOUT tON tOFF IN Test Circuit 4. Switching Times 0.1 F VDD S1 D VDD GND RL 300 CL 35pF VOUT S4 . . . VS1 VS4 . . . 50% 50% 50% 50% tD tD VIN VOUT 0V 0V VIN Test Circuit 5. Break-Before-Make Time Delay, tD VDD SD VDD GND CL 1nF VOUT DECODER VS RS VOUT QINJ = CL VOUT SW OFF SW ON VIN VOUT EN A0 A1 Test Circuit 6. Charge Injection IDS V1 SD VS RON = V1/IDS Test Circuit 1. On Resistance SD VS A A VD IS (OFF) ID (OFF) Test Circuit 2. Off Leakage SD VS A VD ID (ON) Test Circuit 3. On Leakage Test Circuits |
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