| 전자부품 데이터시트 검색엔진 |
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ADG786BCP 데이터시트(PDF) 9 Page - Analog Devices |
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ADG786BCP 데이터시트(HTML) 9 Page - Analog Devices |
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9 / 12 page ![]() REV. 0 ADG786/ADG788 –9– IDS V1 SD VS RON = V1/IDS Test Circuit 1. On Resistance Test Circuits VD IS (OFF) SD VS A Test Circuit 2. IS (OFF) ID (ON) SD A VD NC NC = NO CONNECT Test Circuit 3. ID (ON) S1A D1 VS1B IN/ EN GND RL 300 CL 35pF VOUT VDD VDD 0.1 F S1B VS1A VSS VSS 0.1 F tON 90% 90% 50% 50% ADDRESS DRIVE VOUT VS1B VS1A tOFF Test Circuit 4. Switching Times, tON, tOFF 3V 50% OUTPUT 50% tON(EN) 0.9V0 0V 0V ENABLE DRIVE (VIN) 0.9V0 VO tOFF(EN) A2 VO D1 VS A1 A0 EN GND ADG786 S1A S1B VIN 50 RL 300 CL 35pF VDD VSS VSS VDD 0.1 F Test Circuit 5. Enable Delay, tON (EN), tOFF (EN) VOUT D1 VS GND ADG786/ ADG788 SA SB VIN 50 ADDRESS* *A0, A1, A2 for ADG786, IN1-4 for ADG788 VSS 0.1 F VSS VDD VDD 0.1 F RL 300 CL 35pF ADDRESS 3V VOUT tOPEN 80% 80% 0V VS Test Circuit 6. Break-Before-Make Delay, tOPEN |
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