CSD18534KCS

SLPS383 – SEPTEMBER 2012

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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

ELECTRICAL CHARACTERISTICS

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Static Characteristics

Drain to Source Voltage

60

V

Drain to Source Leakage Current

1

μA

Gate to Source Leakage Current

100

nA

Gate to Source Threshold Voltage

1.5

1.9

2.3

V

10.2

13.3

m

Ω

Drain to Source On Resistance

7.6

9.5

m

Ω

Transconductance

100

S

Dynamic Characteristics

Input Capacitance

1500

1880

pF

Output Capacitance

164

205

pF

Reverse Transfer Capacitance

5.0

6.5

pF

Series Gate Resistance

1.5

3.0

Ω

Gate Charge Total (4.5V)

9.3

12

nC

Gate Charge Total (10V)

19

24

nC

Gate Charge Gate to Drain

3.1

nC

Gate Charge Gate to Source

4.8

nC

Gate Charge at Vth

3.3

nC

Output Charge

18

nC

Turn On Delay Time

4.2

ns

Rise Time

4.8

ns

Turn Off Delay Time

10.4

ns

Fall Time

2.4

ns

Diode Characteristics

Diode Forward Voltage

0.8

1

V

Reverse Recovery Charge

68

nC

di/dt = 300A/

μs

Reverse Recovery Time

49

ns

THERMAL CHARACTERISTICS

PARAMETER

MIN

TYP

MAX

UNIT

Thermal Resistance Junction to Case

1.3

°C/W

Thermal Resistance Junction to Ambient

62

°C/W

2

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