MMDF2P01HD

6

Motorola TMOS Power MOSFET Transistor Device Data

t, TIME

Figure 11. Reverse Recovery Time (trr)

di/dt = 300 A/

µs

Standard Cell Density

High Cell Density

tb

trr

ta

trr

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define

the maximum simultaneous drain–to–source voltage and

drain current that a transistor can handle safely when it is for-

ward biased. Curves are based upon maximum peak junc-

tion temperature and a case temperature (TC) of 25°C. Peak

repetitive pulsed power limits are determined by using the

thermal response data in conjunction with the procedures

discussed in AN569, “Transient Thermal Resistance – Gen-

eral Data and Its Use.”

Switching between the off–state and the on–state may tra-

verse any load line provided neither rated peak current (IDM)

nor rated voltage (VDSS) is exceeded, and that the transition

time (tr, tf) does not exceed 10 µs. In addition the total power

averaged over a complete switching cycle must not exceed

(TJ(MAX) – TC)/(R

θJC).

A power MOSFET designated E–FET can be safely used

in switching circuits with unclamped inductive loads. For reli-

able operation, the stored energy from circuit inductance dis-

sipated in the transistor while in avalanche must be less than

the rated limit and must be adjusted for operating conditions

differing from those specified. Although industry practice is to

rate in terms of energy, avalanche energy capability is not a

constant. The energy rating decreases non–linearly with an

increase of peak current in avalanche and peak junction tem-

perature.

Figure 12. Maximum Rated Forward Biased

Safe Operating Area

0.1

VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)

1

10

RDS(on) LIMIT

THERMAL LIMIT

PACKAGE LIMIT

0.01

VGS = 8 V

SINGLE PULSE

TC = 25°C

10

0.1

dc

10 ms

1

100

100

Mounted on 2” sq. FR4 board (1” sq. 2 oz. Cu 0.06”

thick single sided) with one die operating, 10s max.

1 ms