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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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ACTF2M32A 데이터시트(PDF) 4 Page - Aeroflex Circuit Technology |
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ACTF2M32A 데이터시트(HTML) 4 Page - Aeroflex Circuit Technology |
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4 / 9 page  Aeroflex Circuit Technology SCD1666A REV A 9/12/97 Plainview NY (516) 694-6700 4 AC Characteristics – Write/Erase/Program Operations – WE Controlled (TC = -55 °C to +125°C, VCC = +4.5V to + 5.5V, Unless otherwise specified) Parameter Parameter Symbol Standard Parameter Symbol JEDEC 90ns 120ns 150ns Units Min Max Min Max Min Max Write Cycle Time tWC tAVAV 90 120 150 ns Address Setup to WE Going Low tAS tAVWL 0 0 0 ns Address Hold Time from CE High tAH tWLAX 45 50 50 ns Data Setup to WE Going High tDS tDVWH 45 50 50 ns Data Hold Time from WE High tDH tWHDX 0 0 0 ns Output Enable Hold Time Read tOEH 0 0 0 ns Toggle Bit I and Data Polling 10 10 10 ns Read Recover Time Before Write (OE High to WE Low) tGHWL tGHWL 0 0 0 ns CE Setup Time from WE Low tCS tELWL 0 0 0 ns CE Hold Time from WE High tCH tWHEH 0 0 0 ns WE Pulse Width tWP tWLWH 45 50 50 ns WE Pulse Width High tWPH tWHWL 20 20 20 ns Byte Programming Operation tWHWH1 tWHWH1 8 8 8 µs Sector Erase Operation tWHWH2 tWHWH2 15 15 15 Sec VCC Set-Up Time tVCS 50 50 50 µs Rise Time to VID tVIDR 500 500 500 ns OE Setup Time to WE Active tOESP 4 4 4 µs Reset Pulse Width tRP 500 500 500 ns Program/Erase Valid to RY/BY Delay tBUSY 40 50 60 ns Notes: 1. Not 100% tested. AC Characteristics – Read Only Operations (TC = -55 °C to +125°C, VCC = +4.5V to + 5.5V, Unless otherwise specified) Parameter Parameter Symbol Standard Parameter Symbol JEDEC 90ns 120ns 150ns Units Min Max Min Max Min Max Read Cycle Time (1) tRC tAVAV 90 120 150 ns Address to Output Delay tACC tAVQV 90 120 150 ns CE to Output Delay tCE tELQV 90 120 150 ns OE to Output Delay tOE tGLQV 40 50 55 ns CE to Output in High Z (1) tDF tEHQZ 20 30 35 ns OE to Output in High Z (1) tDF tGHQZ 20 0 30 0 35 ns Output Hold from Addresses, CE or OE Change, Whichever Occurs First tOH tAXQX 0 0 0 ns RESET Low to Read Mode (1) tREADY 20 20 20 µs Notes: 1. Not 100% tested. |
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