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bq76PL536APAP 데이터시트(PDF) 9 Page - Texas Instruments

부품명 bq76PL536APAP
상세설명  3 to 6 Series Cell Lithium-Ion Battery Monitor and Secondary Protection IC for Applications
PDF  60 Pages
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제조업체  TI [Texas Instruments]
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bq76PL536APAP 데이터시트(HTML) 9 Page - Texas Instruments

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SLUSAD3A – JUNE 2011 – REVISED AUGUST 2012
VCn (Cell) Inputs
Typical values stated where TA = 25°C and VBAT = 20 V, Min/Max values stated where TA = –40˚C to 85°C and VBAT = 7.2 V
to 27 V (unless otherwise noted), FUNCTION_CONFIG[]=01xxxx00b for all test conditions (6-µs conversion time selected).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VIN
Input voltage range(1)
VCn – VCn–1, where n = 1 to 6
0
6
V
VRES
Voltage resolution(2)
14 bits
~378
µV
Voltage accuracy, total
–10°C
≤ TA ≤ 50°C, 1.2 V < VIN < 4.5 V
–5
±1
5
VACC
error,
mV
–40°C
≤ TA ≤ 85°C, 1.2 V < VIN < 4.5 V
–8
8
VIN = VCn to VCn–1
RIN
Effective input resistance
Converting
2
M
Ω
CIN
Input capacitance (3)
Converting
1
pF
EN
NoiseSLUSA086559
VIN = 3 V
<250 µVRMS
(1)
0 V may not lie within the range of measured values due to offset voltage limit and device calibration.
(2)
See text for specific conversion formula.
(3)
ADC is factory trimmed at the conversion speed of ~6 µs/channel (FUNC_CONFIG[ADCT1:0] = 01b). Use of a different conversion-
speed setting may affect measurement accuracy.
VBAT (VBRICK) Measurement
Typical values stated where TA = 25°C and VBAT = 20 V, Min/Max values stated where TA = –40˚C to 85°C and VBAT = 7.2 V
to 27 V (unless otherwise noted), FUNCTION_CONFIG[] = 01xxxx00b for all test conditions
PARAMETER
TEST CONDITION
MIN
TYP
MAX
UNIT
Input voltage range(1),
VIN
FUNCTION_CONFIG[] = 0101xx00b
0
30
V
BATn to VSS
VRES
Voltage resolution(2)
14 bits
~1.831
mV
VACC
Voltage accuracy
Total error
–80
–30
20
mV
CIN
Input capacitance
Converting
1
pF
RIN
Effective input resistance
Converting
50
k
Ω
EN
Noise
<1.5
mVRMS
(1)
0 V may not lie within the range of measured values due to offset voltage limit and device calibration.
(2)
See text for specific conversion formula.
GPAI Measurement
Typical values stated where TA = 25°C and VBAT = 20 V, Min/Max values stated where TA = –40˚C to 85°C and VBAT = 7.2 V
to 27 V (unless otherwise noted), FUNCTION_CONFIG[] = 0101xx00b for all test conditions
PARAMETER
TEST CONDITION
MIN
TYP
MAX
UNIT
Input voltage range,(1)
VIN
0
2.5
V
GPAI+ to GPAI–
VRES
Voltage resolution(2)
14 bits
~153
µV
0.25 V
≤ VIN ≤ 2.5 V
–7
7
Voltage accuracy, VIN =
VACC
mV
GPAI+ – GPAI–
VIN = 1.25 V, TA = 25°C
±2
CIN
Input capacitance
Converting
40
pF
RIN
Effective input resistance
Converting
50
K
Ω
EN
Noise
<150
µVRMS
(1)
0 V may not lie within the range of measured values due to offset voltage limit and device calibration.
(2)
See text for specific conversion formula.
TSn Measurement
Typical values stated where TA = 25°C and VBAT = 20V, Min/Max values stated where TA = –40˚C to 85°C and VBAT = 7.2V to
27V (unless otherwise noted), FUNCTION_CONFIG[]=01xxxx00b for all Test Conditions
PARAMETER
TEST CONDITION
MIN
TYP
MAX
UNIT
VIN
Input voltage range,(1) TSn+ TSn–
0
2.5
V
(1)
0 V may not lie within the range of measured values due to offset voltage limit and device calibration.
Copyright © 2011–2012, Texas Instruments Incorporated
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