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SP483EEN-L 데이터시트(PDF) 9 Page - Exar Corporation

부품명 SP483EEN-L
상세설명  Enhanced Low EMI Half-Duplex RS-485 Transceiver
PDF  12 Pages
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제조업체  EXAR [Exar Corporation]
홈페이지  http://www.exar.com
Logo EXAR - Exar Corporation

SP483EEN-L 데이터시트(HTML) 9 Page - Exar Corporation

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Exar Corporation 48720 Kato Road, Fremont CA, 94538 • 50-668-707 • www.exar.com
SP483E_00_02092
With the Air Discharge Method, an ESD
voltage is applied to the equipment under
test (EUT) through air. This simulates an
electrically charged person ready to connect
a cable onto the rear of the system only to
findanunpleasantzapjustbeforetheperson
touches the back panel. The high energy
potential on the person discharges through
an arcing path to the rear panel of the system
before he or she even touches the system.
This energy, whether discharged directly or
throughair,ispredominantlyafunctionofthe
discharge current rather than the discharge
voltage. Variableswithanairdischargesuch
as approach speed of the object carrying the
ESD potential to the system and humidity
will tend to change the discharge current.
For example, the rise time of the discharge
current varies with the approach speed.
The Contact Discharge Method applies the
ESDcurrentdirectlytotheEUT. Thismethod
was devised to reduce the unpredictability
of the ESD arc. The discharge current rise
time is constant since the energy is directly
transferred without the air-gap arc. In situ-
ations such as hand held systems, the ESD
charge can be directly discharged to the
equipment from a person already holding
the equipment. The current is transferred
on to the keypad or the serial port of the
equipment directly and then travels through
the PCB and finally to the IC.
The circuit model in Figures 9 and 10 repre-
sent the typical ESD testing circuit used for
all three methods. The C
S is initially charged
with the DC power supply when the first
switch (SW1) is on. Now that the capacitor
is charged, the second switch (SW2) is on
while SW1 switches off.
t = 0ns
t = 30ns
0A
15A
30A
t →
Figure 11. ESD Test Waveform for IEC61000-4-2
The voltage stored in the capacitor is then
applied through R
S, the current limiting
resistor, onto the device under test (DUT).
In ESD tests, the SW2 switch is pulsed so
that the device under test receives a dura-
tion of voltage.
For the Human Body Model, the current
limitingresistor(R
S) and the source capacitor
(C
S) are 1.5kΩ an 100pF, respectively. For
IEC-61000-4-2, the current limiting resistor
(R
S) and the source capacitor (CS) are 330Ω
an 150pF, respectively.
The higher C
S value and lower RS value in
the IEC61000-4-2 model are more stringent
than the Human Body Model. The larger
storage capacitor injects a higher voltage
to the test point when SW2 is switched on.
The lower current limiting resistor increases
the current charge onto the test point.
DEVICE PIN
TESTED
HUMAN BODY
MODEL
IEC6000-4-2
Air Discharge Direct Contact Level
Driver Outputs
Receiver Inputs
+/-5kV
+/-5kV
+/-5kV
+/-5kV
+/-8kV
+/-8kV
4
4
Table 1. Transceiver ESD Tolerance levels



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