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LP38798 데이터시트(PDF) 2 Page - Texas Instruments

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부품명 LP38798
상세설명  LP38798-ADJ High PSRR, Ultra Low Noise, 800 mA Linear Voltage Regulator for RF/Analog Circuits
PDF  23 Pages
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제조업체  TI [Texas Instruments]
홈페이지  http://www.ti.com
Logo TI - Texas Instruments

LP38798 데이터시트(HTML) 2 Page - Texas Instruments

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IN
EN
CP
GND(CP)
OUT
SET
FB
GND
OUT
OUT(FB)
IN
IN(CP)
Exposed Pad
on Bottom
(DAP)
1
2
3
4
5
6
7
8
9
10
11
12
LP38798
SNOSCT6A – MARCH 2013 – REVISED MAY 2013
www.ti.com
Connection Diagram
Top View
Connect WSON DAP to GND at Pins 6 and 7
Figure 1. LP38798SD-ADJ
12-Lead WSON Package (Top View)
PIN DESCRIPTIONS
Pin
Name
Function
1, 2
IN
Device unregulated input voltage pins. Connect pins together at the package.
3
IN(CP)
Charge pump input voltage pin. Connect directly to pins 1 and 2 at the package.
Charge pump output. See Charge Pump section in the Applications Information
4
CP
for more information.
Enable pin. A Logic high level is required on this pin to enable the LDO output.
A Logic low level will turn the output off and reduce the operating current of the
5
EN
device. See Enable Input Operation section in the Applications Information for
more information.
6
GND
Device charge pump ground pin.
7
GND
Device analog ground pin.
8
FB
Feedback pin for programming the output voltage.
Internally filtered pre-buffered output. A feedback resistor divider network from
9
SET
this pin to FB and GND will set the output voltage of the device.
10
OUT(FB)
OUT buffer feedback pin. Connect directly to pins 11 and 12 at the package.
11, 12
OUT
Device regulated output voltage pins. Connect pins together at the package.
The exposed die attach pad on the bottom of the package should be connected
to a thermal pad at ground potential. See 12-Lead WSON Package Thermal
Exposed Pad
DAP
Considerations section in the APPLICATIONS INFORMATION for more
information.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
2
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: LP38798



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