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ICS83021I 데이터시트(PDF) 4 Page - Integrated Device Technology

부품명 ICS83021I
상세설명  1-TO-1 DIFFERENTIAL- TO-LVCMOS/LVTTL TRANSLATOR
PDF  12 Pages
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제조업체  IDT [Integrated Device Technology]
홈페이지  http://www.idt.com
Logo IDT - Integrated Device Technology

ICS83021I 데이터시트(HTML) 4 Page - Integrated Device Technology

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ICS83021I
1-TO-1 DIFFERENTIAL-TO-LVCMOS/LVTTL TRANSLATOR
IDT™ / ICS™ LVCMOS/LVTTL TRANSLATOR
4
ICS83031AMI REV. C OCTOBER 31, 2008
AC Electrical Characteristics
Table 4A. AC Characteristics, VDD = 3.3V ± 0.3V, TA = -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the
device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after
thermal equilibrium has been reached under these conditions.
All parameters measured at fMAX unless noted otherwise.
NOTE 1: Measured from the differential input crossing point to the output at VDD/2.
NOTE 2: Defined as skew between outputs on different devices operating at the same supply voltage and with equal load conditions.
Using the same type of inputs on each device, the outputs are measured at VDD/2.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
Table 4B. AC Characteristics, VDD = 2.5V ± 5%, TA = -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the
device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after
thermal equilibrium has been reached under these conditions.
All parameters measured at fMAX unless noted otherwise.
NOTE 1: Measured from the differential input crossing point to the output at VDD/2.
NOTE 2: Defined as skew between outputs on different devices operating at the same supply voltage and with equal load conditions.
Using the same type of inputs on each device, the outputs are measured at VDD/2.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
Parameter
Symbol
Test Conditions
Minimum
Typical
Maximum
Units
fMAX
Output Frequency
350
MHz
tPD
Propagation Delay, NOTE 1
ƒ
≤ 350MHz
1.7
2.0
2.3
ns
tsk(pp)
Part-to-Part Skew; NOTE 2, 3
500
ps
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section
100MHz, Integration Range
(637kHz – 10MHz)
0.21
ps
tR / tF
Output Rise/Fall Time
0.8V to 2V
100
250
400
ps
odc
Output Duty Cycle
ƒ
≤ 166MHz
45
50
55
%
166MHz < ƒ
≤ 350MHz
40
50
60
%
Parameter
Symbol
Test Conditions
Minimum
Typical
Maximum
Units
fMAX
Output Frequency
350
MHz
tPD
Propagation Delay, NOTE 1
ƒ
≤ 350MHz
1.9
2.2
2.5
ns
tsk(pp)
Part-to-Part Skew; NOTE 2, 3
500
ps
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section
100MHz, Integration Range
(637kHz – 10MHz)
0.21
ps
tR / tF
Output Rise/Fall Time
20% to 80%
250
550
ps
odc
Output Duty Cycle
ƒ
≤ 250MHz
45
50
55
%
250MHz < ƒ
≤ 350MHz
40
50
60
%



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