EP3SE110 datasheet(35/341 Pages) ALTERA

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Chapter 1: Stratix III Device Datasheet: DC and Switching Characteristics

1–25

Switching Characteristics

Altera Corporation

Stratix III Device Handbook, Volume 2

Figure 1–3 shows the LVDS Soft-CDR/ DPA sinusoidal jitter tolerance specifications

for Stratix III devices.

Table 1–27 lists the LVDS Soft-CDR/ DPA sinusiodal jitter mask values for Stratix III

devices.

External Memory Interface Specifications

The following sections describe the external memory I/O timing specifications and

the DLL and DQS block specifications.

f For more information about the maximum clock rate support for external memory

interfaces with a half-rate or full-rate controller, refer to Section III: System Performance

Specifications of the External Memory Interfaces Handbook.

External Memory I/O Timing Specifications

Table 1–28 and Table 1–29 list Stratix III device timing uncertainties on the read and

write data paths. Use these specifications to determine timing margins for source

synchronous paths between the Stratix III FPGA and the external memory device. For

more information, refer to the figure for “SW (sampling window)” in the “Glossary”

on page 1–326.

Figure 1–3. LVDS Soft-CDR/DPA Sinusiodal Jitter Tolerance Specification for Stratix III Devices

Table 1–27. LVDS Soft-CDR/DPA Sinusoidal Jitter Mask Values for Stratix III Devices

Jitter Frequency (Hz)

Jitter Amplitude

Unit

10,000

25.000

17,565

25.000

1,493,000

0.350

50,000,000

0.350

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