EVAL-ADE7755EBZ datasheet(4/20 Pages) AD

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ADE7755

Rev. A | Page 4 of 20

Parameter

Min

Typ

Max

Unit

Test Conditions/Comments

POWER SUPPLY

For specified performance

AVDD

4.75

5 V − 5%

5.25

5 V + 5%

DVDD

4.75

5 V − 5%

5.25

5 V + 5%

AIDD

Typically 2 mA

DIDD

2.5

Typically 1.5 mA

1 See the Terminology section.

2 See the Typical Performance Characteristics section for the plots.

3 Sample tested during initial release and after any redesign or process change that may affect this parameter.

TIMING CHARACTERISTICS

AVDD = DVDD = 5 V ± 5%, AGND = DGND = 0 V, on-chip reference, CLKIN = 3.58 MHz, TMIN to TMAX = −40°C to +85°C.

Table 2.

Parameter1, 2

Specification

Unit

Test Conditions/Comments

t13

275

F1 and F2 pulse width (logic low)

See Table 7

sec

Output pulse period; see the Transfer Function section

1/2 t2

sec

Time between F1 falling edge and F2 falling edge

t43, 4

CF pulse width (logic high)

See Table 8

sec

CF pulse period; see the Transfer Function section

CLKIN/4

sec

Minimum time between F1 and F2 pulse

1 Sample tested during initial release and after any redesign or process change that may affect this parameter.

2 See Figure 2.

3 The pulse widths of F1, F2, and CF are not fixed for higher output frequencies. See the Frequency Outputs section.

4 The CF pulse is always 18 μs in the high frequency mode. See the Frequency Outputs section and Table 8.

Figure 2. Timing Diagram for Frequency Outputs

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