VINLDO12

SYNC

VIN1

SW1

FB1

GND_SW1

VIN2

SW2

2.2 PH

2.2 PH

10 PF

10 PF

1 PF

10 PF

FB2

GND_SW2

AVDD

10 PF

1 PF

0.47 PF

1 PF

1 PF

0.47 PF

GND_C

GND_L

SCL

SDA

LDO2

LDO1

VINLDO2

VINLDO1

ENSW2

ENSW1

ENLDO2

ENLDO1

EN_T

LP3906

DAP

LP3906

www.ti.com

SNVS456M – AUGUST 2006 – REVISED MAY 2013

Dual High-Current Step-Down DC/DC and Dual Linear Regulator with I2C Compatible

Interface

Check for Samples: LP3906

1

FEATURES

KEY SPECIFICATIONS

2

•

Compatible with Advanced Applications

•

DC/DC Converter (Buck)

Processors and FPGAs

–

1.5A Output Current

•

2 LDOs for Powering Internal Processor

–

Functions and I/Os

–

Buck1 : 0.8V–2.0V

•

High Speed Serial Interface for Independent

–

Buck2 : 1.0V–3.5V

Control of Device Functions and Settings

–

Up to 96% Efficiency

•

Precision Internal Reference

–

2 MHz PWM Switching Frequency

•

Thermal Overload Protection

–

±3% Output Voltage Accuracy

•

Current Overload Protection

–

Automatic Soft Start

•

24-lead 5 × 4 × 0.8 mm WQFN Package

•

Linear Regulators (LDO)

•

Software Programmable Regulators

–

–

±3% Output Voltage Accuracy

APPLICATIONS

–

300 mA Output Currents

•

FPGA, DSP Core Power

–

25 mW (Typ) Dropout

•

Applications Processors

•

Peripheral I/O Power

DESCRIPTION

The LP3906 is a multi-function, programmable Power

Management Unit, optimized for low power FPGAs,

Microprocessors and DSPs.

Typical Application Circuits

Figure 1. Typical Application Circuit

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

2

All trademarks are the property of their respective owners.

PRODUCTION DATA information is current as of publication date.

Copyright © 2006–2013, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.