HALL-EFFECT,

DIRECTION-DETECTION

SENSORS

www.allegromicro.com

CRITERIA FOR DEVICE QUALIFICATION

All Allegro sensors are subjected to stringent qualification requirements prior to being released to production. To

become qualified, except for the destructive ESD tests, no failures are permitted.

Test Method and

Samples

Qualification Test

Test Conditions

Test Length

Per Lot

Comments

Temperature Humidity

JESD22-A101,

1000 hrs

77

Device biased for

Bias Life

°C, RH = 85%

minimum power

Bias Life

JESD22-A108,

1000 hrs

77

(Surge Operating Life)

JESD22-A108,

1000 hrs

77

Autoclave, Unbiased

JESD22-A102,

96 hrs

77

°C, 15 psig

High-Temperature

JESD22-A103,

1000 hrs

77

(Bake) Storage Life

Temperature Cycle

JESD22-A104

1000 cycles

77

-55

°C to +150°C

ESD,

CDF-AEC-Q100-002

Pre/Post

3 per

Test to failure

Human Body Model

Reading

test

All leads > 8 kV

SENSOR LOCATIONS

(

±0.005” [0.13 mm] die placement)

A

E1

E2

Dwg. MH-007-1

0.014"

0.37 mm

NOM

BRANDED

SURFACE

ACTIVE AREA DEPTH

0.059"

1.50 mm

12

4

5

3

0.096"

2.44 mm

0.072"

1.83 mm