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3

A3

A2

A1

1

2

3

4

5

6

7

8

16

15

14

1

12

11

10

9

GND

A0

SDA

SCL

LDAC

DAC8574

ABSOLUTE MAXIMUM RATINGS

(1)

DAC8574

SLAS377B – JANUARY 2003 – REVISED DECEMBER 2004

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated

circuits be handled with appropriate precautions. Failure to observe proper handling and installation

procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision

integrated circuits may be more susceptible to damage because very small parametric changes could

cause the device not to meet its published specifications.

PACKAGE/ORDERING INFORMATION

PRODUCT

PACKAGE

PACKAGE

SPECIFICATION

PACKAGE

ORDERING

TRANSPORT MEDIA

DRAWING

TEMPERATURE

MARKING

NUMBER

NUMBER

RANGE

DAC8574

16-TSSOP

PW

–40

°C TO +105°C

D8574I

DAC8574IPW

90 Piece Tube

DAC8574IPWR

2000 Piece Tape and Reel

PW PACKAGE

PIN DESCRIPTIONS

(TOPVIEW)

PIN

NAME

DESCRIPTION

1

Analog output voltage from DAC A

2

Analog output voltage from DAC B

3

Positive reference voltage input

4

Analog voltage supply input

5

Negative reference voltage input

Ground reference point for all circuitry on the

6

GND

part

7

Analog output voltage from DAC C

8

Analog output voltage from DAC D

9

LDAC

10

SCL

Serial clock input

11

SDA

Serial data input

12

I/O voltage supply input

13

A0

14

A1

15

A2

Device address select - Extended

16

A3

Device address select - Extended

-0.3 V to +6 V

Digital input voltage to GND

Operating temperature range

40

°C to +105°C

Storage temperature range

65

°C to +150°C

+150

°C

Power dissipation:

Thermal impedance (

ΘJA)

118

°C/W

Thermal impedance (

ΘJC)

29

°C/W

Lead temperature, soldering:

Vapor phase (60s)

215

°C

Infrared (15s)

220

°C

(1)

Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute

maximum conditions for extended periods may affect device reliability.

2