| 전자부품 데이터시트 검색엔진 |
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CL31A106KB 데이터시트(PDF) 2 Page - Samsung semiconductor |
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CL31A106KB 데이터시트(HTML) 2 Page - Samsung semiconductor |
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2 / 2 page ![]() Vibration Test Capacitance change : within ±5% Amplitude : 1.5mm Tan δ, IR : initial spec. From 10㎐ to 55㎐ (return : 1min.) 2hours 3 direction (x, y, z) Moisture Capacitance change : within ±12.5% With rated voltage Resistance Tan δ : 0.125 max 40±2℃, 90~95%RH, 500+12/-0 hour IR : More than 12.5㏁·㎌ High Temperature Capacitance change : within ±12.5% With of the rated voltage Resistance Tan δ : 0.125 max Max. operating temperature IR : More than 25㏁·㎌ 1000+48/-0 hour Temperature Capacitance change : within ±7.5% 1 cycle condition Cycling Tan δ, IR : initial spec. Min. operating temperature → 25℃ → Max. operating temperature → 25℃ 5 cycles test C. Recommended Soldering method : Reflow ( Reflow Peak Temperature : 260+0/-5℃, 10sec. Max ) * For the more detail Specification, Please refer to the Samsung MLCC catalogue. Performance Test condition 150% |
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