DS1000 datasheet(4/5 Pages) DALLAS

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DS1000

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TEST CIRCUIT Figure 3

TERMINOLOGY

Period: The time elapsed between the leading edge of the first pulse and the leading edge of the

following pulse.

tWI (Pulse Width): The elapsed time on the pulse between the 1.5V point on the leading edge and the

1.5V point on the trailing edge or the 1.5V point on the trailing edge and the 1.5V point on the leading

edge.

tRISE (Input Rise Time): The elapsed time between the 20% and the 80% point on the leading edge of the

input pulse.

tFALL (Input Fall Time): The elapsed time between the 80% and the 20% point on the trailing edge of the

input pulse.

tPLH (Time Delay, Rising): The elapsed time between the 1.5V point on the leading edge of the input

pulse and the 1.5V point on the leading edge of any tap output pulse.

tPHL (Time Delay, Falling): The elapsed time between the 1.5V point on the trailing edge of the input

pulse and the 1.5V point on the trailing edge of any tap output pulse.

TEST SETUP DESCRIPTION

Figure 3 illustrates the hardware configuration used for measuring the timing parameters on the DS1000.

The input waveform is produced by a precision pulse generator under software control. Time delays are

measured by a time interval counter (20 ps resolution) connected between the input and each tap. Each

tap is selected and connected to the counter by a VHF switch control unit. All measurements are fully

automated, with each instrument controlled by a central computer over an IEEE 488 bus.

DS1000 데이터시트(PDF) 4 Page - Dallas Semiconductor