STM32L152C6 datasheet(83/131 Pages) STMICROELECTRONICS

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STM32L151x6/8/B, STM32L152x6/8/B

Electrical characteristics

105

Output driving current

The GPIOs (general purpose input/outputs) can sink or source up to ±8 mA, and sink or

source up to ±20 mA (with the non-standard VOL/VOH specifications given in Table 43.

In the user application, the number of I/O pins which can drive current must be limited to

respect the absolute maximum rating specified in Section 6.2:

•

The sum of the currents sourced by all the I/Os on VDD, plus the maximum Run

consumption of the MCU sourced on VDD, cannot exceed the absolute maximum rating

IVDDΣ (see Table 11).

•

The sum of the currents sunk by all the I/Os on VSS plus the maximum Run

consumption of the MCU sunk on VSS cannot exceed the absolute maximum rating

IVSSΣ (see Table 11).

Output voltage levels

Unless otherwise specified, the parameters given in Table 43 are derived from tests

performed under ambient temperature and VDD supply voltage conditions summarized in

Table 13. All I/Os are CMOS and TTL compliant.

Table 43. Output voltage characteristics

Symbol

Parameter

Conditions

Min

Max

Unit

VOL(1)(2)

Output low level voltage for an I/O pin

IIO = +8 mA

2.7 V < VDD < 3.6 V

-0.4

VOH(3)(2)

Output high level voltage for an I/O pin

2.4

VOL (1)(4) Output low level voltage for an I/O pin

IIO =+ 4 mA

1.65 V < VDD < 2.7 V

-0.45

VOH (3)(4) Output high level voltage for an I/O pin

VDD-0.45

VOL(1)(4)

Output low level voltage for an I/O pin

IIO = +20 mA

2.7 V < VDD < 3.6 V

-1.3

VOH(3)(4) Output high level voltage for an I/O pin

VDD-1.3

1. The IIO current sunk by the device must always respect the absolute maximum rating specified in Table 11 and the sum of

IIO (I/O ports and control pins) must not exceed IVSS.

2. Tested in production.

3. The IIO current sourced by the device must always respect the absolute maximum rating specified in Table 11 and the sum

of IIO (I/O ports and control pins) must not exceed IVDD.

4. Based on characterization data, not tested in production.

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