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ZIOL2202 데이터시트(PDF) 46 Page - List of Unclassifed Manufacturers |
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ZIOL2202 데이터시트(HTML) 46 Page - List of Unclassifed Manufacturers |
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46 / 91 page ![]() ZIOL2xxx – IC Family IO-Link compliant HV Line Driver IC Family Data Sheet January 31, 2012 © 2012 Zentrum Mikroelektronik Dresden AG — Rev. 2.2.1 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is PRELIMINARY and subject to changes without notice. 46 of 90 Reg.-Name Addr. Bit-Field Bit Reset- Value r/w Comment Reference 26 RESERVED 7:2 0 r/rst RESERVED 26 MON_LINE_FAULT 0 r/rst Line fault occurred 26 MON_UNDER_VOLTAGE 0 r/rst Under voltage occurred Manufacture Use Only 27:30 7:0 0 r Read returns 0 PRODUCT_ID 31 7:0 ID r Allows to retrieve product and revision information Added in Rev B 3.3.10. Interrupt and IC Lock Mode Control 3.3.10.1. Interrupt Handling The INT_L pin provides indication functionality for a set of IC-internal exceptions. Once an exception had occurred, expressed as logic low of the INT_L signal, the actual cause can be evaluated by reading the IC’s status register via the SPI interface. Depending on the condition – a reset of the exception by reading the corresponding status register can be performed. The following exceptions are combined in the INT indication functionality: Lock caused by power fail detector (refer to chapter 3.5) Lock caused by COM-Overload (refer to chapter 3.3.10) Lock caused by AUX-Overload (refer to chapter 3.3.10) Lock caused by over-temperature (refer to chapter 3.3.10) EEPROM-single-bit-error (refer to chapter 3.3.7) EEPROM-2bit-error (refer to chapter 3.3.7) Valid-flag-cleared due to possibly corrupt EEPROM (refer to chapter 3.3.7) WURQ detected (refer to chapter 3.3.4) Figure 3.14 illustrates the handling of the above mentioned exceptions and their monitoring. It also shows how to configure the interrupt (INT_L pin) and wake-up (WURQ_L pin) signal generation. Besides several exceptions concerning channel overload, die over-temperature and IO-Link specific wake-up situations the IC can also signal problems as regards the EEPROM. Since the configuration registers get their content initially from the EEPROM, the data should be correct. The following described features make sure that no corrupt EEPROM data can cause unwanted IC configurations. |
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