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MA28151 데이터시트(PDF) 16 Page - Dynex Semiconductor

부품명 MA28151
상세설명  Radiation hard Programmable Communication Interface
PDF  22 Pages
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제조업체  DYNEX [Dynex Semiconductor]
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6. DC CHARACTERISTICS AND RATINGS
Parameter
Min
Max
Units
Supply Voltage
-0.5
7
V
Input Voltage
-0.3
VDD+0.3
V
Current Through Any Pin
-20
+20
mA
Operating Temperature
-55
125
°C
Storage Temperature
-65
150
°C
Note: Stresses above those listed may cause permanent
damage to the device. This is a stress rating only and
functional operation of the device at these conditions, or at
any other condition above those indicated in the operations
section of this specification, is not implied. Exposure to
absolute maximum rating conditions for extended periods
may affect device reliability.
Figure 25: Absolute Maximum Ratings
Total dose radiation not
exceeding 3x10
5 Rad(SI)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
VDD
Supply Voltage
-
4.5
5.0
5.5
V
VIH
Input High Voltage
-
2.2
-
-
V
VIL
Input Low Voltage
-
-
-
0.8
V
VOH
Output High Voltage
IOH = -2mA
VDD-0.5
-
-
V
VOL
Output Low Voltage
IOL = 5mA
-
-
VSS+0.4
V
IIN
Input Leakage Current (Note 1)
VDD = 5.5V,
-
-
±10
µA
VIN = VSS or VDD
IOZ
Tristate Leakage Current (Note 1)
VDD = 5.5V,
-
-
±50
µA
VIN = VSS or VDD
IDD
Power Supply Current
Static, VDD = 5.5V
-
0.1
10
mA
VDD = 5V±10%, over full operating temperature range.
Mil-Std-883, method 5005, subgroups 1, 2, 3
Note 1: Guaranteed but not tested at -55
°C
Figure 26: Electrical Characteristics
Subgroup
Definition
1
Static characteristics specified in Figure 26 at +25
°C
2
Static characteristics specified in Figure 26 at +125
°C
3
Static characteristics specified in Figure 26 at -55
°C
7
Functional characteristics specified in Figure 24 at +25
°C
8A
Functional characteristics specified in Figure 24 at +125
°C
8B
Functional characteristics specified in Figure 24 at -55
°C
9
Switching characteristics specified in Figure 23 at +25
°C
10
Switching characteristics specified in Figure 23 at +125
°C
11
Switching characteristics specified in Figure 23 at -55
°C
Figure 27: Definition of Mil-Std-883, Method 5005 Subgroups



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