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MA28151 데이터시트(PDF) 16 Page - Dynex Semiconductor |
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MA28151 데이터시트(HTML) 16 Page - Dynex Semiconductor |
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16 / 22 page ![]() MA28151 16/22 6. DC CHARACTERISTICS AND RATINGS Parameter Min Max Units Supply Voltage -0.5 7 V Input Voltage -0.3 VDD+0.3 V Current Through Any Pin -20 +20 mA Operating Temperature -55 125 °C Storage Temperature -65 150 °C Note: Stresses above those listed may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these conditions, or at any other condition above those indicated in the operations section of this specification, is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Figure 25: Absolute Maximum Ratings Total dose radiation not exceeding 3x10 5 Rad(SI) Symbol Parameter Conditions Min Typ Max Units VDD Supply Voltage - 4.5 5.0 5.5 V VIH Input High Voltage - 2.2 - - V VIL Input Low Voltage - - - 0.8 V VOH Output High Voltage IOH = -2mA VDD-0.5 - - V VOL Output Low Voltage IOL = 5mA - - VSS+0.4 V IIN Input Leakage Current (Note 1) VDD = 5.5V, - - ±10 µA VIN = VSS or VDD IOZ Tristate Leakage Current (Note 1) VDD = 5.5V, - - ±50 µA VIN = VSS or VDD IDD Power Supply Current Static, VDD = 5.5V - 0.1 10 mA VDD = 5V±10%, over full operating temperature range. Mil-Std-883, method 5005, subgroups 1, 2, 3 Note 1: Guaranteed but not tested at -55 °C Figure 26: Electrical Characteristics Subgroup Definition 1 Static characteristics specified in Figure 26 at +25 °C 2 Static characteristics specified in Figure 26 at +125 °C 3 Static characteristics specified in Figure 26 at -55 °C 7 Functional characteristics specified in Figure 24 at +25 °C 8A Functional characteristics specified in Figure 24 at +125 °C 8B Functional characteristics specified in Figure 24 at -55 °C 9 Switching characteristics specified in Figure 23 at +25 °C 10 Switching characteristics specified in Figure 23 at +125 °C 11 Switching characteristics specified in Figure 23 at -55 °C Figure 27: Definition of Mil-Std-883, Method 5005 Subgroups |
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