2SD1615, 2SD1615A

3

0.01 0.02

0.05 0.1 0.2

0.5

1

2

5

10

1

2

5

10

20

50

100

200

500

1000

GAIN BANDWIDTH PRODUCT vs.

EMITTER CURRENT

1

2

5

10

20

50

100

2

5

10

20

50

100

OUTPUT CAPCITANCE vs.

COLLECTOR TO BASE VOLTAGE

0.01 0.02

0.05

0.1

0.2

0.5

1

0.05

0.1

0.2

0.5

1

2

SWITCHING TIME vs.

COLLECTOR CURRENT

PW = 2 s

Duty Cycle

≤ 2 %

µ

..

REFERENCE

Document Name

Document No.

NEC semiconductor device reliability/quality control system.

TEI-1202

Quality grade on NEC semiconductor devices.

IEI-1209

Semiconductor device mounting technology manual.

IEI-1207

Semiconductor device package manual.

IEI-1213

Guide to quality assurance for semiconductor devices.

MEI-1202

Semiconductor selection guide.

MF-1134