1-177

V

O

0.5 V

O

V

(min.)

5 V

0 V

SWITCH AT A: I = 0 mA

F

SWITCH AT B: I = 3.5 mA

F

CM

V

H

CM

O

V

(max.)

CM

V

(PEAK)

+5 V

7

5

6

8

2

3

4

1

CC

V

0.1 µF

BYPASS

GND

OUTPUT V

MONITORING

NODE

O

PULSE GEN.

Z

= 50

Ω

O

+

_

350

Ω

B

A

CM

V

HCPL-261A/261N

-60

0

TA – TEMPERATURE – °C

100

90

120

-20

30

20

60

-40

0

40

80

60

VCC = 5 V

VEH = 3 V

VEL = 0 V

IF = 3.5 mA

tELH, RL = 4 kΩ

tELH, RL = 1 kΩ

tEHL, RL = 350 Ω, 1k Ω, 4 kΩ

tELH, RL = 350 Ω

OUTPUT V

MONITORING

NODE

O

1.5 V

INPUT

O

V

OUTPUT

3.0 V

1.5 V

+5 V

7

5

6

8

2

3

4

1

PULSE GEN.

Z

= 50

Ω

t = t = 5 ns

O

f

L

R

CC

V

0.1 µF

BYPASS

*C

IS APPROXIMATELY 15 pF WHICH INCLUDES

PROBE AND STRAY WIRING CAPACITANCE.

L

GND

r

3.5 mA

MONITORING NODE

HCPL-261A/261N

Figure 17. Test Circuit for Common Mode Transient Immunity and

Typical Waveforms.

Figure 16. Typical Enable Propaga-

tion Delay vs. Temperature. HCPL-

261A/-261N/-061A/-061N Only.

Figure 18. Thermal Derating Curve,

Dependence of Safety Limiting Value

with Case Temperature per

VDE 0884.

0

0

TS – CASE TEMPERATURE – °C

200

50

400

125

25

75 100

150

600

800

200

100

300

500

700

PS (mW)

IS (mA)

HCPL-261A/261N OPTION 060 ONLY

175