28F016XD datasheet(21/54 Pages) INTEL

부품명	28F016XD

상세설명	16-MBIT (1 MBIT x 16) DRAM-INTERFACE FLASH MEMORY

PDF	54 Pages

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제조업체	INTEL [Intel Corporation]

홈페이지	http://www.intel.com

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28F016XD FLASH MEMORY

5.3 Transient Input/Output Reference Waveforms

TEST POINTS

INPUT

OUTPUT

2.0

0.8

2.0

2.4

0.45

0533_05

AC test inputs are driven at V

OH (2.4 VTTL) for a Logic “1” and VOL (0.45 VTTL) for a Logic “0.” Input timing begins at VIH

(2.0 VTTL) and V

IL (0.8 VTTL). Output timing ends at VIH and VIL. Input rise and fall times (10% to 90%) <10 ns.

Figure 5. Transient Input/Output Reference Waveform for VCC = 5.0V ± 0.5V(1)

TEST POINTS

INPUT

OUTPUT

1.5

3.0

0.0

1.5

0533_06

AC test inputs are driven at 3.0V for a Logic “1” and 0.0V for a Logic “0.” Input timing begins, and output timing ends, at 1.5V.

Input rise and fall times (10% to 90%) <10 ns.

Figure 6. Transient Input/Output Reference Waveform for VCC = 3.3V ± 0.3V(2)

NOTES:

1. Testing characteristics for 28F016XD-85.

2. Testing characteristics for 28F016XD-95.

28F016XD 데이터시트(PDF) 21 Page - Intel Corporation