7-1099

Specifications CD4095BMS, CD4096BMS

TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS

FUNCTION

OPEN

GROUND

VDD

9V

± -0.5V

OSCILLATOR

50kHz

25kHz

CD4095BMS

Static Burn-In 1

Note 1

1, 6, 8

2-5, 7, 9-13

14

Static Burn-In 2

Note 1

1, 6, 8

7

2-5, 9-14

Dynamic Burn-

In Note 1

1

2, 7, 13

3-5, 9-11, 14

6, 8

-

12

Irradiation

Note 2

1, 6, 8

7

2-5, 9-14

CD4096BMS

Static Burn-In 1

Note 1

1, 6, 8

2-5, 7, 9-13

14

Static Burn-In 2

Note 1

1, 6, 8

7

2-5, 9-14

Dynamic Burn-

In Note 1

1

2, 5, 7, 9, 13

3, 4, 10, 11, 14

6, 8

12

Irradiation

Note 2

1, 6, 8

7

2-5, 9-14

NOTES:

1. Each pin except VDD and GND will have a series resistor of 10K

± 5%, VDD = 18V ± 0.5V

2. Each pin except VDD and GND will have a series resistor of 47K

± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD

= 10V

± 0.5V