| 전자부품 데이터시트 검색엔진 |
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NP83P06PDG-E2-AYNote 데이터시트(PDF) 8 Page - Renesas Technology Corp |
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NP83P06PDG-E2-AYNote 데이터시트(HTML) 8 Page - Renesas Technology Corp |
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8 / 9 page ![]() Data Sheet D18691EJ3V0DS 6 NP83P06PDG PACKAGE DRAWING (Unit: mm) TO-263 (MP-25ZP) No plating 7.88 MIN. 2.54 0.75 ±0.2 0.5 2 13 4 4.45 ±0.2 1.3 ±0.2 0.6 ±0.2 0 to 8˚ 1. Gate 2. Drain 3. Source 4. Fin (Drain) 0.025 to 0.25 0.25 10.0 ±0.3 EQUIVALENT CIRCUIT Source Body Diode Gate Drain Remark Strong electric field, when exposed to this device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. |
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