| 전자부품 데이터시트 검색엔진 |
|
TN0985 데이터시트(PDF) 13 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
TN0985 데이터시트(HTML) 13 Page - STMicroelectronics |
|
13 / 32 page ![]() DocID024294 Rev 4 13/32 TN0985 Procedure 32 2.3 Radiation The radiation guarantee depends on the product series: • M54HCMOS series: each wafer is tested to a total dose of 50 krad according to the ESCC 22900. The corresponding radiation verification test (RVT) report is included in the documentation provided with each shipment. • CMOS4000B series: each wafer lot is tested to a total dose of 100 krad according to the ST internal specification. The corresponding RVT report is included in the documentation provided with each shipment. 2.4 Marking The devices are marked as follows (see also Figure 3): • Date code/ST logo/country of origin (e.g. FR = France) • ESCC detailed specification number + specific variant as shown in Table 7. Table 6. Parameter drift values Characteristic Symbols Limits Units Drift value Absolute Min. Max. Threshold voltage N-channel VTHn ±0.4 -0.7 -3 V Threshold voltage P-channel VTHp 0.7 3 Table 7. Variant table Package Gold finish Hot solder dipped Flat 21 23 |
|
링크 URL |
| ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크 투 데이터시트 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |