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AN2683 데이터시트(PDF) 28 Page - STMicroelectronics |
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AN2683 데이터시트(HTML) 28 Page - STMicroelectronics |
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28 / 38 page ![]() Functional testing AN2683 28/38 The graphs in Figure 14 and 15 show that the 1.8 V output has better efficiency than the 1.0 V output, in the high eighties at high current levels. Along with the efficiency measurements further functional testing was conducted as outlined in the following sections. 4.1 Input/output voltage The input voltage was swept from 10.2 to 16 VDC at the load levels indicated. The output voltage was recorded at each level and did not vary more than 1 mV over the entire input range. Input/output voltage at different load levels. 4.2 Ripple/noise voltage The maximum peak to peak ripple voltage was measured at the load level indicated. 4.3 Load transient overshoot The output load levels were varied in a stepwise fashion at the percentage and load levels indicated. The maximum change in output voltage was recorded in the following oscilloscope photographs. Table 2. 1.0 VDC output Load current Output voltage 50 mA 0.998 VDC 7.5 A 1.019 VDC 10.5 A 1.027 VDC Table 3. 1.8 VDC output Load current Output voltage 50 mA 1.792 VDC 1.8 A 1.794 VDC 2.5 A 1.794 VDC Table 4. 1.0 VDC output Load current Ripple voltage p-p 10.5 A 25 mV Table 5. 1.8 VDC output Load current Ripple voltage p-p 2.5 A 20 mV |
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