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AN2985 데이터시트(PDF) 13 Page - STMicroelectronics

부품명 AN2985
상세설명  The STEVAL-IFP010V3 demonstration board has been developed
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제조업체  STMICROELECTRONICS [STMicroelectronics]
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AN2985
EMC immunity tests
Doc ID 15716 Rev 2
13/19
Figure 13.
Burst timing waveform
Table 4 shows the results of a burst test. Normal performance has been observed when
applying two different disturbance levels on the output ports and Vcc main voltage power
supply.
2.3
Surge test
A high energy surge test was performed in differential mode. A high surge signal was
injected on the DUT (device under test) through a 42
Ω decoupling resistor. The test
consisted of three positive and three negative discharges with a repetition rate of 1
discharge per minute.
Figure 14 shows the standard timing waveform applied on the DUT.
Table 4.
Burst test results
Burst standard
test routines
Level
Voltage
level (kV)
Acceptance criteria(1)
1.
Classification of the test:
(Criteria A): normal performance
(Criteria B): temporary degradation or loss of function or performance with automatic return to normal operation
(Criteria C): temporary degradation or loss of function with external intervention to recover normal operation
(Criteria D): degradation or loss of function, need replacement of damaged components to recover normal
operation.
IEC 61000-4-4
Level 1
0.5
A
IEC 61000-4-4
Level 2
1
A
IEC 61000-4-4
Level 3
2
A
IEC 61000-4-4
Level 4
4
A



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