AN4075

Application EMC immunity

Doc ID 022954 Rev 1

21/23

4.3.5

Conclusion

Immunity of different L6360 pins was evaluated and the external protection circuit adjusted

accordingly. The protection circuit which showed the best EMC performance is used in the

STEVAL-IFP016V2 application.

C/Q transceiver

approximately 1.5 V) during the surge test. If the negative pulse is higher than the

mentioned value, the internal structure can be damaged. It is recommended to short both

a 560 pF ceramic capacitor and one diode of SPT01-335DEE array.

I/Q receiver

The I/Q pin should be protected in a similar way against negative overvoltages. Tests

(STPS1L40), a 15

Ω resistor in series, a 560 nF capacitor and one diode of SPT01-335DEE

array. When a 15

Ω resistor is omitted, the chip fails at -2 kV CM surge pulse amplitude.

L+ driver

Protecting the L+ pin with a 100 nF ceramic capacitor and one diode of SPT01-335DEE

array showed sufficient immunity against 2.5 kV CM / 1 kV DM surge pulses.

External protection circuits in the application provide sufficient immunity against surge

pulses (CM/DM) applied to supply lines. Even 2.5 kV surge pulses did not cause

degradation of the L6360 IC.

Table 8.

Application supply surge immunity CM, DM

Surge test signal amplitude, test result at polarity (+ / -)

Applied to:

500 V

1 kV

1.5 kV

2 kV

2.5 kV

- / -

- / -

- / -

- / -

1.

The values of the L6360 internal registers did not change.

2.

The L6360 registers were reset and IRQ signal activated.

B(2) / B(2)

B(2) / B(2)

B(2) / B(2)

B(2) / B(2)