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LTC4557 데이터시트(PDF) 8 Page - Linear Technology

부품명 LTC4557
상세설명  Dual SIM/Smart Card Power Supply and Interface
PDF  12 Pages
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제조업체  LINER [Linear Technology]
홈페이지  http://www.linear.com
Logo LINER - Linear Technology

LTC4557 데이터시트(HTML) 8 Page - Linear Technology

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LTC4557
4557f
OPERATIO
Activation/Deactivation
Activation and deactivation sequencing is handled by
built-in circuitry. The activation sequence is initiated by
bringing the ENABLE pin HIGH. The activation sequence is
outlined below:
1. The RST, CLK and I/O pins are held LOW.
2. VCC is enabled.
3. After VCC is stable at its selected level, The I/O and RST
channels are enabled.
4. The clock channel is enabled on the rising edge of the
second clock cycle after the I/O pin is enabled.
The deactivation sequence is initiated by bringing the
ENABLE pin LOW. The deactivation sequence is outlined
below:
1. The reset channel is disabled and RST is brought LOW.
2. The clock channel is disabled and the CLK pin is brought
LOW two clock cycles after ENABLE is brought LOW. If
the clock is not running, the clock channel will be
disabled approximately 9
µs after the ENABLE pin is
brought LOW.
3. The I/O channel is disabled and the I/O pin is brought
LOW approximately 9
µs after the ENABLE is brought
LOW.
4. VCC will be depowered after the I/O pin is brought LOW.
The activation or deactivation sequences will take place
every time a card socket is enabled or disabled.
Fault Protection
The VCC, I/O, RST and CLK pins are all protected against
short-circuit faults. While there are no logic outputs to
indicate that a fault has occurred, these pins will be able
to tolerate the fault condition until it has been removed.
The VCCA,B, I/OA,B, and RSTA,B pins possess fault protec-
tion circuitry which will limit the current available to the
pins. Each VCC pin is capable of supplying approximately
90mA (typ) before the output voltage is reduced.
The CLKA,B pins are designed to tolerate faults by reduc-
ing the current drive capability of their output stages. After
a fault is detected by the internal fault detection logic, the
logic waits for a fault detection delay to elapse before
reducing the current drive capability of the output stage.



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