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AN3031 데이터시트(PDF) 23 Page - STMicroelectronics

부품명 AN3031
상세설명  SCLT3-8 input termination demonstration board
PDF  28 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
홈페이지  http://www.st.com
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AN3031 데이터시트(HTML) 23 Page - STMicroelectronics

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AN3031
EMC requirements
Doc ID 16144 Rev 1
23/28
6
EMC requirements
6.1
Procedure to evaluate the robustness of the SCLT3-8BT8
The reference for evaluating the robustness of the SCLT3-8BT8 device is the IEC 61131-2
international standard. This international standard provides all requirements and test
conditions applicable to programmable logic controllers (PLCs) and their associated
peripherals.
The IEC 61131-2 standard specifies the electromagnetic compatibility (EMC) requirements
and the nature of the tests to perform in to determine if the system meets these
requirements. The levels of each test depend on the zone where the system will be installed.
The most typical industrial environmental levels correspond to zone B: local power
distribution zone and dedicated power distribution zone (see table 28: “EMC immunity
zones” of the IEC 61131-2-Ed2 standard). The following paragraphs recall the test levels for
this zone.
6.2
ESD tests (according to IEC 61000-4-2)
The electrostatic discharge test shall be applied to operator accessible devices. This means
that these tests have to be performed on each connector pin. The required levels are: air
discharge: ±8 kV contact discharge: ±4 kV.
The PLC system shall continue to operate as intended. Temporary degradation of the
performance is acceptable during the test, but the system must recover by itself after the
test (criteria “B” according to the IEC61131-2 standard).
6.3
Burst tests (according to IEC 61000-4-4)
The fast transient burst tests must be applied on all input pins of the system. A capacitive
clamp-coupling device (50-200 pF) must be used as described in the IEC 61000-4-4
standard. The required burst voltage levels are: analog or DC I/O: ±1 kV, DC power line: ±2
kV. The PLC system shall continue to operate as intended. Temporary degradation of the
performance is acceptable during the test, but the system must recover by itself after the
test (criteria “B” according to the IEC 61131-2 standard).
6.4
Surge test (according to IEC 61000-4-5)
Since the voltage surge consists of a single but energetic pulse, the SCLT3-8BT8 device
embeds an overvoltage protection on each point. The absorbed energy complies at least
with the requirements of the IEC 61131-2 standard. The high energy surge test must be
applied on all input pins of the system. For all analog inputs, the coupling method is a 42
Ω
serial resistor and a 0.5 µF capacitor. For DC power line, the coupling is 2
Ω, 18 µF with
differential mode, and 12
Ω, 9 µF with common mode. The required voltage surge levels are:
analog or DC I/O: 0.5 kV (line-to-line and line-to-earth coupling modes), DC power line: 0.5
kV (line-to-line), DC power line: 1 kV (line-to-earth). The PLC system shall continue to
operate as intended. Temporary degradation of the performance is acceptable during the
test, but the system must recover by itself after the test (criteria “B” according to the IEC
61131-2 standard).



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