2

Wire Supplying

Vbias from

Agilent 4142

Direct to

Ground

Direct to

Ground

RF

Input

Blocking

Cap

Bias

RF Output

Reference

Planes

Bias

Tee

Vdd supply from

Agilent 4142

Figure 1b. A diagram showing the connection to the DUT during an S and

Noise parameter measurement using an automated tuner system.

Note:

Package marking

provides orientation

and identification:

“6C” = Device Code

“x” = Date code

indicates the month

of

manufac-

ture.

OUTPUT

GND

GND

GND

INPUT

1

2

3

6

5

4 BIAS

Feedback

Vd

Bias

1, 2, 5

4

3

Input

match

6

RFin

GND

RFout

Simplified Schematic

Pin Connections and Package Marking

Figure 1a. Test circuit of the 0.5 GHz production test board used for NF, Gain

and OIP3 measurements. This circuit achieves a trade-off between optimal

NF, Gain, OIP3 and input return loss. Circuit losses have been de-embedded

from actual measurements.

+

6.8 nH

100 pF

3

1 25

6

4

100 pF

MGA-68563

47 nH

68 pF

10 nF

3V

4300

Ω

Notes:

1. Operation of this device above any one of

these parameters may cause permanent

damage.

2. Bias is assumed at DC quiescent conditions.

3. With the DC (typical bias) and RF applied to

the device at board temperature TB = 25°C.

4. Total dissipation power is referred to lead

“5” temperature. Tc=92°C, derate Pdiss at

10.3mW/°C for Tc>92°C.

5. Thermal resistance measured using 150°C

Liquid Crystal Measurement method.

Symbol

Parameter

Units

Absolute

Maximum

V6

mA

100

CW RF Input (pin3)

(Vd=0V, Id=0mA)

dBm

dBm

21

21

Bias Reference Current (pin 4)

mA

1

mW

600

Channel Temperature

°C

150

Storage Temperature

°C

150

°C/W

97