2.5Gbps, Low-Power, +3.3V

Clock Recovery and Data Retiming IC

2

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ABSOLUTE MAXIMUM RATINGS

DC ELECTRICAL CHARACTERISTICS

Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional

operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to

absolute maximum rating conditions for extended periods may affect device reliability.

Input Voltage Levels

Input Current Levels (SDI+, SDI-, SLBI+, SLBI-)..............±10mA

PECL Output Voltage

PECL Output Current, (SDO+, SDO-, SCLKO+, SCLKO-).....56mA

Voltage at LOL, SIS, PHADJ+, PHADJ-,

TQFP (derate 16.1mW/°C above +85°C) ........................1.0W

Operating Temperature Range

MAX3875EHJ..................................................-40°C to +85°C

Operating Junction Temperature (die) ..............-55°C to +150°C

Storage Temperature Range .............................-60°C to +160°C

Processing Temperature (die) .........................................+400°C

Lead Temperature (soldering, 10sec) .............................+300°C

Figure 1

Excluding PECL output termination

CONDITIONS

V

Single-Ended Input Voltage

(SDI±, SLBI±)

mVp-p

50

800

mA

122

167

Supply Current

Differential Input Voltage

(SDI±, SLBI±)

V

2.4

TTL Output High Voltage (LOL)

µA

-10

+10

TTL Input Current (SIS)

V

0.8

TTL Input Low Voltage (SIS)

Ω

45

(SDI±, SLBI±)

V

PECL Output High Voltage

(SDO±, SCLKO±)

V

PECL Output Low Voltage

(SDO±, SCLKO±)

V

2.0

TTL Input High Voltage (SIS)

UNITS

MIN

TYP

MAX

SYMBOL

PARAMETER

TTL Output Low Voltage (LOL)

0.4

V

Figure 1. Input Amplitude

Figure 2. Output Clock-to-Q Delay

SCLKO+

SDO

SDI+

SDI-

(SDI+) -

(SDI-)

50mVp-p MIN

800mVp-p MAX

25mV MIN

400mV MAX