| 전자부품 데이터시트 검색엔진 |
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NX5P2553 데이터시트(PDF) 12 Page - NXP Semiconductors |
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NX5P2553 데이터시트(HTML) 12 Page - NXP Semiconductors |
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12 / 24 page ![]() NX5P2553 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved. Product data sheet Rev. 1 — 6 July 2015 12 of 24 NXP Semiconductors NX5P2553 Precision adjustable current-limited power switch Test data is given in Table 14. Definitions test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. VEXT = External voltage for measuring switching times. Fig 10. Test circuit for measuring switching times aaa-011077 EN VOUT CL VIN VEXT G VI RL Table 14. Test data Supply voltage EN input Load VEXT VI(EN) CL RL 2.5 V 0 V to VI(VIN) 1 F 100 5.5 V 0 V to VI(VIN) 1 F 100 Fig 11. Typical characteristics reference schematic aaa-007803 10 kΩ 10 μF 150 μF FAULT FAULT signal VIN control signal EN VIN VOUT VOUT ILIM GND RILIM |
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