| 전자부품 데이터시트 검색엔진 |
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KAF-8300 데이터시트(PDF) 14 Page - ON Semiconductor |
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KAF-8300 데이터시트(HTML) 14 Page - ON Semiconductor |
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14 / 28 page ![]() KAF−8300 www.onsemi.com 14 Table 8. SPECIFICATIONS (continued) Description Notes Maximum Number Allowed Threshold Definition Symbol MONOCHROME DEVICES Point Defect, Dark Reference DR_BPnts Bright Point in the Dark Reference Region 7.5 mV 0 5 Dim Points, Dark Field BPnt333_13 Dark Field, Minor, Long Integration Time, tINT = 1/3 s 13 mV 32,500 Total Points Bright and Dark Points BPnt33_7 + Bfld_Pnt_D + Bfld_Pnt_B − 800 Cluster Defect Total_Clst A Cluster is a Group of 2 or 10 Adjacent Defective Dark or Bright Points − 6 Perpendicular Pattern Defect Total_Perp Dark Field Very Long Exposure Bright Cluster where 9 or more Adjacent Point Defects Exist, Very Long Integration Time, tINT = 1 s 3.04 mV 0 Column Defect, Bright Field Bfld_Col_D Bfld_Col_B A Column which Deviates above or below Neighboring Columns under Illuminated Conditions (> 300 mV Signal) greater that the Threshold 1.5% 1.5% 0 Column Defect, Dark Field Dfld_Col2 Dfld_Col4 Lo_Col_B Lo_Col_D Lo_Col_B1 Lo_Col_D1 A Column which Deviates above or below Neighboring Columns under Non-Illuminated or Low Light Level Conditions (~10 mV) greater than the Threshold 1 mV 1 mV 1 mV 1 mV 1 mV 1 mV 0 5 5 5 5 Row Defect Dfld_Row Row Defect if Row Average Deviates above Threshold 1 mV 0 LOD Bright Col, Dark Dfld_LodCol Defines Functionality and Uniform Efficiency of LOD Structure 1.5 mV 0 1. This parameter is only a quality metric and these points will not be considered for cluster and point criteria. 2. For the color version of this device, the green pixels in a red row (GR) are considered a different color plane than the green pixels in a blue row (GB). For monochrome version the entire active area is treated as a single color plane. 3. Operating temperature = 60 °C. 4. As the gradient threshold is defined as 8.5 mV maximum across a 16 × 16 pixel region about each pixel. 5. Operating temperature = 25 °C. |
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