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P3P623S00B 데이터시트(PDF) 3 Page - ON Semiconductor |
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P3P623S00B 데이터시트(HTML) 3 Page - ON Semiconductor |
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3 / 9 page ![]() P3P623S00B, P3P623S00E www.onsemi.com 3 Table 2. PIN DESCRIPTION FOR P3P623S00E Pin # Pin Name Type Description 1 CLKIN (Note 1) Input External reference Clock input, 5 V tolerant input 2 CLKOUT1 (Note 2) Output Buffered clock output (Note 4) 3 VDD Power 3.3 V supply 4 SS% (Note 3) Input Spread Spectrum Selection. Refer to the Spread Spectrum Control and Input−Output Skew Table. Has an internal pull up resistor. 5 GND Power Ground 6 CLKOUT2 (Note 2) Output Buffered clock output (Note 4) 7 CLKOUT3 (Note 2) Output Buffered clock output (Note 4) 8 DLY_CTRL Output External Input−Output Delay control 9 SSON (Note 3) Input Spread Spectrum enable and disable option. When SSON is HIGH, the spread spectrum is enabled and when LOW, it turns off the spread spectrum. Has an internal pull up resistor. 10 CLKOUT4 (Note 2) Output Buffered clock output (Note 4) 11 CLKOUT5 (Note 2) Output Buffered clock output (Note 4) 12 GND Power Ground 13 VDD Power 3.3 V supply 14 CLKOUT6 (Note 2) Output Buffered clock output (Note 4) 15 CLKOUT7 (Note 2) Output Buffered clock output (Note 4) 16 CLKOUT (Note 2) Output Buffered clock output (Note 4) 1. Weak pull down 2. Weak pull−down on all outputs 3. Weak pull−up on these inputs 4. Buffered clock output is Timing−Safe Table 3. SPREAD SPECTRUM CONTROL AND INPUT−OUTPUT SKEW Device Input Frequency SS % Deviation Input−Output Skew ( +TSKEW) P3P623S00B/E 32 MHz 0 ±0.25% 0.125 1 ±0.50% 0.25 Table 4. ABSOLUTE MAXIMUM RATINGS Symbol Parameter Rating Unit VDD Supply Voltage to Ground Potential −0.5 to +4.6 V VIN DC Input Voltage (CLKIN) −0.5 to +7 TSTG Storage temperature −65 to +125 °C Ts Max. Soldering Temperature (10 sec) 260 °C TJ Junction Temperature 150 °C TDV Static Discharge Voltage (As per JEDEC STD22− A114−B) 2 KV Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. |
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