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LM35DZ 데이터시트(PDF) 8 Page - Texas Instruments |
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LM35DZ 데이터시트(HTML) 8 Page - Texas Instruments |
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8 / 31 page ![]() LM35 SNIS159F – AUGUST 1999 – REVISED JANUARY 2016 www.ti.com 6.7 Electrical Characteristics: LM35, LM35C, LM35D Limits Unless otherwise noted, these specifications apply: −55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to TMAX in the circuit of Figure 14. LM35 LM35C, LM35D PARAMETER TEST CONDITIONS UNIT TYP TESTED DESIGN TYP TESTED DESIGN LIMIT(1) LIMIT(2) LIMIT(1) LIMIT(2) TA = 25°C ±0.4 ±1 ±0.4 ±1 TA = –10°C ±0.5 ±0.5 ±1.5 Accuracy, LM35, °C LM35C(3) TA = TMAX ±0.8 ±1.5 ±0.8 ±1.5 TA = TMIN ±0.8 ±1.5 ±0.8 ±2 TA = 25°C ±0.6 ±1.5 Accuracy, LM35D(3) TA = TMAX ±0.9 ±2 °C TA = TMIN ±0.9 ±2 TMIN ≤ TA ≤ TMAX, Nonlinearity(4) ±0.3 ±0.5 ±0.2 ±0.5 °C –40°C ≤ TJ ≤ 125°C TMIN ≤ TA ≤ TMAX, 10 9.8 10 9.8 Sensor gain –40°C ≤ TJ ≤ 125°C mV/°C (average slope) 10 10.2 10 10.2 TA = 25°C ±0.4 ±2 ±0.4 ±2 Load regulation(5) mV/mA TMIN ≤ TA ≤ TMAX, 0 ≤ IL ≤ 1 mA ±0.5 ±5 ±0.5 ±5 –40°C ≤ TJ ≤ 125°C TA = 25°C ±0.01 ±0.1 ±0.01 ±0.1 Line regulation(5) mV/V 4 V ≤ VS ≤ 30 V, ±0.02 ±0.2 ±0.02 ±0.2 –40°C ≤ TJ ≤ 125°C VS = 5 V, 25°C 56 80 56 80 VS = 5 V, –40°C ≤ TJ ≤ 125°C 105 158 91 138 Quiescent current(6) µA VS = 30 V, 25°C 56.2 82 56.2 82 VS = 30 V, –40°C ≤ TJ ≤ 125°C 105.5 161 91.5 141 4 V ≤ VS ≤ 30 V, 25°C 0.2 2 0.2 2 Change of quiescent µA 4 V ≤ VS ≤ 30 V, current(5) 0.5 3 0.5 3 –40°C ≤ TJ ≤ 125°C Temperature coefficient of –40°C ≤ TJ ≤ 125°C 0.39 0.7 0.39 0.7 µA/°C quiescent current Minimum temperature In circuit of Figure 14, IL = 0 1.5 2 1.5 2 °C for rate accuracy Long term stability TJ = TMAX, for 1000 hours ±0.08 ±0.08 °C (1) Tested Limits are ensured and 100% tested in production. (2) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels. (3) Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C). (4) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device. (5) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance. (6) Quiescent current is defined in the circuit of Figure 14. 8 Submit Documentation Feedback Copyright © 1999–2016, Texas Instruments Incorporated Product Folder Links: LM35 |
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