USB5537B datasheet(10/79 Pages) MICROCHIP

10 / 79 page

USB5537B

DS00001682C-page 10

 2012 - 2015 Microchip Technology Inc.

TMS

JTAG TMS

Used for JTAG boundary scan.

OCS2

Over-Current Sense 2

Input from external current monitor indicating an over-current condition.

Note:

This pin also provides configuration strap functions.

See Note 3-3.

TDI

JTAG TDI

Used for JTAG boundary scan.

OCS3

Over-Current Sense 3

Input from external current monitor indicating an over-current condition.

Note:

This pin also provides configuration strap functions.

See Note 3-3.

TDO

O12

JTAG TDO

Used for JTAG boundary scan.

OCS4

Over-Current Sense 4

Input from external current monitor indicating an over-current condition.

Note:

This pin also provides configuration strap functions.

See Note 3-3.

MISC

RESET_N

Reset Input

The system uses this active low signal to reset the chip. The active low

pulse should be at least 1

s wide.

XTALIN

ICLKx

Crystal Input: 25 MHz crystal.

This pin connects to either one terminal of the crystal or to an external

25 MHz clock when a crystal is not used.

CLK_IN

External Clock Input

This pin connects to either one terminal of the crystal or to an external

25 MHz clock when a crystal is not used.

XTALOUT

OCLKx

Crystal Output

The clock output, providing a crystal 25 MHz. When an external clock

source is used to drive XTALIN/CLKIN, this pin becomes a no connect.

TEST

IPD

Test Pin

Treat as a no connect pin or connect to ground. No trace or signal

should be routed or attached to this pin.

RBIAS

I-R

USB Transceiver Bias

A12.0 k

 (+/- 1%) resistor is attached from ground to this pin to set the

transceiver’s internal bias settings.

ATEST

Analog Test Pin

This signal is used for testing the chip and must always be connected

to ground.

SM_CLK

I/O12

SMBus Clock

SM_DAT

I/O12

SMBus Data Pin

Note:

This pin is MUXed with PRT_CTRL5

TABLE 3-1:

USB5537B PIN DESCRIPTIONS (CONTINUED)

Symbol

Buffer Type

Description

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