DocID026580 Rev 6

11/25

STGIF7CH60TS-L

Fault management

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Fault management

The device integrates an open-drain output connected to SD Pin. As soon as a fault occurs

the open-drain is activated and LVGx outputs are forced low. Two types of fault can be

detected:

•

Overcurrent (OC) sensed by the internal comparator (see more detail in Section 4.2:

Smart shutdown function);

•

Each fault enables the SD open drain for a different time; refer to the following Table 10:

Fault timing.

The device actually device remains in a fault condition (SD at low logic level and LVGx

outputs disabled) for a time also depending on RC network connected to SD pin. The

network generates a time contribution that is added to the internal value.

Figure 4. Overcurrent timing (without contribution of RC network on SD)

Table 10. Fault timing

Symbol

Parameter

Event time

SD open-drain enable

time result

OC

Over-current event

≤ 20 μs

20

μs

≥ 20µs

OC time

UVLO

Under-voltage lock out

event

≤ 50 μs

50 µs

≥ 50 µs

until the VCC_LS exceed the

VCC_LS UV turn ON threshold

UVLO time