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TSX561ILT 데이터시트(PDF) 17 Page - STMicroelectronics

부품명 TSX561ILT
상세설명  Micropower, wide bandwidth (900 kHz), 16 V CMOS operational amplifiers
PDF  28 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
홈페이지  http://www.st.com
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TSX561ILT 데이터시트(HTML) 17 Page - STMicroelectronics

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DocID023274 Rev 4
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TSX56x, TSX56xA
Application information
28
Equation 5
To evaluate the op-amp reliability, a follower stress condition is used where VCC is defined
as a function of the maximum operating voltage and the absolute maximum rating (as
recommended by JEDEC rules).
The Vio drift (in µV) of the product after 1000 h of stress is tracked with parameters at
different measurement conditions (see Equation 6).
Equation 6
The long term drift parameter (ΔVio), estimating the reliability performance of the product, is
obtained using the ratio of the Vio (input offset voltage value) drift over the square root of the
calculated number of months (Equation 7).
Equation 7
where Vio drift is the measured drift value in the specified test conditions after 1000 h stress
duration.
4.5
PCB layouts
For correct operation, it is advised to add 10 nF decoupling capacitors as close as possible
to the power supply pins.
4.6
Macromodel
Accurate macromodels of the TSX56x, TSX56xA devices are available on the
STMicroelectronics’ website at www.st.com. These models are a trade-off between
accuracy and complexity (that is, time simulation) of the TSX56x and TSX56xA operational
amplifiers. They emulate the nominal performance of a typical device within the specified
operating conditions mentioned in the datasheet. They also help to validate a design
approach and to select the right operational amplifier, but they do not replace on-board
measurements.
Months
AF 1000 h
×
12 months
24 h
365.25 days
×
()
×
=
VCC
maxVop with Vicm
VCC 2
==
ΔVio
Viodrift
months
()
------------------------------
=



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