| 전자부품 데이터시트 검색엔진 |
|
JH35320480BCNUMNFZCWC 데이터시트(PDF) 14 Page - Jewel Hill Electronic |
|
|
|||||||||||||||||||||||||||||
JH35320480BCNUMNFZCWC 데이터시트(HTML) 14 Page - Jewel Hill Electronic |
|
14 / 22 page ![]() JH35320480B VER: 0.1 - 13 - Issue date: 2013/08/01 JEWEL HILL ELECTRONIC CO.,LTD. display abnormally, liquid crystal leak are not allowed. 7) After testing, the current Idd should be within initial value ±20%. 8) No low temperature bubbles ,end seal loose and fall, frame rainbow, ACF bubble growing are allowable in the appearance test. 11. Inspection Criterion 11.1. Sampling Method Unless otherwise agreed upon in writing, the sampling inspection shall be applied to the Customer’s incoming inspection. 1) Lot size: Quantity per shipment lot 2) Sampling type: Normal inspection , single sampling 3) Inspection level: Ⅱ 4) Sampling table: MIL-STD-105D 5) Acceptable Quality Level(AQL): Major=0.65 Minor=1.5 11.2. Inspection Method 1) Ambient Condition: a. Temperature: Room temperature 25±5℃ b. Illumination: Single fluorescent lamp non-directive(300 to 700 Lux) 2) Viewing distance The distance between the LCD and the inspector’s eyes shall be at least 30-50cm. 3) Viewing Angle The inspection shall be conducted within normal viewing angle range. |
|
|
링크 URL |
| ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크 투 데이터시트 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |