JH45540960A

VER: 1.0

- 12 -

Issue date: 2013/08/15

JEWEL HILL ELECTRONIC CO.,LTD.

10.Reliability and Inspection Standard

No.

Test Item

Test Conditions

Remark

Storage

80℃, 120Hr

Note

1

High Temperature

Operation

70℃, 120Hr

Note

Storage

-30℃, 120Hr

2

Low Temperature

Operation

-20℃, 120Hr

Note

3

High Temperature and High

Humidity

60℃, 90%RH, 120Hr

Note

Storage

-10℃(1Hr) 25℃(5min) 60℃(1Hr)

32 Cycles

4

Temperature Cycle

Operation

-20℃(1Hr) 25℃(5min) 60℃(1Hr)

25 Cycles

Note

5

Peeling Off (Storage)

≧

500gf/cm

Note

6

FPC Bending Test

≧

6,000 times, 2/sec

Note

7

Vibration Test(Storage)

50HZ, 30min,

Amplitude: 2 cm, X/Y/Z directions

Note

8

Drop Test

60cm/ 3Corner/ 8Face, 1Cycle

Note

Note:

1) The test samples should be applied to only one test item.

2) Sample size for each test item is 5~10pcs.

3) For Damp Proof Test, pure water(Resistance>1MΩ) should be used.

4) In case of malfunction defect caused by ESD damage, if it would be recovered to

normal state after resetting, it would be judged as a good part.

5) EL evaluation should be excepted from reliability test with humidity and temperature:

Some defects such as black spot/blemish can happen by natural chemical reaction

with humidity and fluorescence EL has.

6) After the reliability test, the test samples should be inspected after 2 hours at least.

display abnormally, liquid crystal leak are not allowed.

8) After testing, the current Idd should be within initial value ±20%.

9) No low temperature bubbles ,end seal loose and fall, frame rainbow, ACF bubble

growing are allowable in the appearance test.