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CD4012C 데이터시트(PDF) 3 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
부품명 CD4012C
상세설명  Dual 4-Input NOR(NAND) Gate
PDF  6 Pages
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제조업체  NSC [National Semiconductor (TI)]
홈페이지  http://www.national.com
Logo NSC - National Semiconductor (TI)

CD4012C 데이터시트(HTML) 3 Page - National Semiconductor (TI)

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DC Electrical Characteristics CD4002C CD4012C
Limits
Symbol
Parameter
Conditions
b
55 C
a
25 C
a
85 C
Units
Min
Max
Min
Typ
Max
Min
Max
IDD
Quiescent
VDD e 50V
05
0005
05
15
m
A
Device Current
VDD e 10V
50
0005
50
30
m
A
PD
Quiescent Device
VDD e 50V
25
0025
25
75
m
W
DissipationPackage VDD e 10V
50
005
50
300
m
W
VOL
Output Voltage
VDD e 50V VI e VDD IO e 0A
005
0
005
005
V
Low Level
VDD e 10V VI e VDD IO e 0A
005
0
005
005
V
VOH
Output Voltage
VDD e 50V VI e VSS IO e 0A
495
495
50
495
V
High Level
VDD e 10V VI e VSS IO e 0A
995
995
10
995
V
VNL
Noise Immunity
VDD e 50V VO t 36V IO e 0A
15
15
225
14
V
(All Inputs)
VDD e 10V VO t 72V IO e 0A
30
30
45
29
V
VNH
Noise Immunity
VDD e 50V VO s 095V IO e 0A
14
15
225
15
V
(All Inputs)
VDD e 10V VO s 29V IO e 0A
29
30
45
30
V
IDN
Output Drive Current
VDD e 50V VO e 04V VI e VDD
035
03
10
024
mA
N-Channel (4002)
VDD e 10V VO e 05V VI e VDD
072
06
25
048
mA
(Note 2)
IDN
Output Drive Current
VDD e 50V VO e 04V VI e VDD
0145
012
05
0095
mA
N-Channel (4012)
VDD e 10V VO e 05V VI e VDD
03
025
06
02
mA
(Note 2)
IDP
Output Drive Current
VDD e 50V VO e 25V VI e VSS
b
035
b
03
b
20
b
024
mA
P-Channel (4002)
VDD e 10V VO e 95V VI e VSS
b
03
b
025
b
10
b
02
mA
(Note 2)
IDP
Output Drive Current
VDD e 50V VO e 25V VI e VSS b0145
b
012
b
05
b
0095
mA
P-Channel (4012)
VDD e 10V VO e 95V VI e VSS
b
035
b
03
b
12
b
024
mA
(Note 2)
II
Input Current
10
pA
Note 1
‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed Except for ‘‘Operating Temperature Range’’
they are not meant to imply that the devices should be operated at these limits The table of ‘‘Electrical Characteristics’’ provides conditions for actual device
operation
Note 2
IDN and IDP are tested one output at a time
3



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