SP3243B datasheet(18/24 Pages) SIPEX

18 / 24 page

Rev. 6/30/03

SP3223B/3243B +3.0V to +5.5V RS-232 Transceivers

ESD TOLERANCE

The SP3223B/3243B series incorporates

ruggedized ESD cells on all driver output and

receiver input pins. The ESD structure is

improved over our previous family for more

rugged applications and environments sensitive

to electro-static discharges and associated

transients.

The Human Body Model has been the generally

accepted ESD testing method for semiconductors.

This method is also specified in MIL-STD-883,

Method 3015.7 for ESD testing. The premise of

this ESD test is to simulate the human body’s

potential to store electrostatic energy and

discharge it to an integrated circuit.

The

simulation is performed by using a test model as

shown in Figure 30. This method will test the

IC’s capability to withstand an ESD transient

during normal handling such as in manufacturing

areas where the ICs tend to be handled frequently.

For the Human Body Model, the current limiting

resistor (RS) and the source capacitor (CS) are

1.5k

Ω and 100pF, respectively.

SW1

SW2

Device

Under

Test

DC Power

Source

SW1

SW2

Figure 30. ESD Test Circuit for Human Body Model

SP3243B 데이터시트(PDF) 18 Page - Sipex Corporation