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DF2B36FU 데이터시트(PDF) 2 Page - Toshiba Semiconductor

부품명 DF2B36FU
상세설명  ESD Protection Diodes Silicon Epitaxial Planar
PDF  10 Pages
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제조업체  TOSHIBA [Toshiba Semiconductor]
홈페이지  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

DF2B36FU 데이터시트(HTML) 2 Page - Toshiba Semiconductor

  DF2B36FU Datasheet HTML 1Page - Toshiba Semiconductor DF2B36FU Datasheet HTML 2Page - Toshiba Semiconductor DF2B36FU Datasheet HTML 3Page - Toshiba Semiconductor DF2B36FU Datasheet HTML 4Page - Toshiba Semiconductor DF2B36FU Datasheet HTML 5Page - Toshiba Semiconductor DF2B36FU Datasheet HTML 6Page - Toshiba Semiconductor DF2B36FU Datasheet HTML 7Page - Toshiba Semiconductor DF2B36FU Datasheet HTML 8Page - Toshiba Semiconductor DF2B36FU Datasheet HTML 9Page - Toshiba Semiconductor Next Button
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DF2B36FU
2
4.
4.
4.
4. Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, Taaaa = 25
= 25
= 25
= 25
))))
Characteristics
Electrostatic discharge voltage (IEC61000-4-2)(Contact)
Electrostatic discharge voltage (IEC61000-4-2)(Air)
Electrostatic discharge voltage (ISO10605)(Contact)
Electrostatic discharge voltage (ISO10605)(Air)
Peak pulse power (tp = 8/20 µs)
Peak pulse current (tp = 8/20 µs)
Junction temperature
Storage temperature
Symbol
VESD
VESD
PPK
IPP
Tj
Tstg
Note
(Note 1)
(Note 2)
(Note 3)
Rating
±20
±20
150
2.5
150
-55 to 150
Unit
kV
kV
W
A
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: According to IEC61000-4-2.
Note 2: According to ISO10605. (@ C = 330 pF, R = 2 kΩ)
Note 3: According to IEC61000-4-5.
2016-03-25
Rev.1.0
©2016 Toshiba Corporation



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