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PI6CFGL401B 데이터시트(PDF) 4 Page - Pericom Semiconductor Corporation |
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PI6CFGL401B 데이터시트(HTML) 4 Page - Pericom Semiconductor Corporation |
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4 / 14 page ![]() 4 www.pericom.com 06/05/15 All trademarks are property of their respective owners. PI6CFGL401B 4-Output Low Power PCIE Gen 1-2-3 Clock Generator Electrical Characteristics–Current Consumption (T A = -40~85 o C; VDD = 3.3V +/- 10%; VDDO = 1.8V +/- 10%, See Test Loads for Loading Conditions) Symbol Parameters Condition Min. Type Max. Units I DDAOP Operating Supply Current1 VDDA3.3, All outputs active @100MHz 40 mA I DDOP Total power consumption, All outputs active @100MHz 53 mA I DDSUSP Suspend Supply Current1 VDDREF1.8, CKPWRGD_PD# = 0, Wake-On- LAN enabled 8 mA I DDPD Powerdown Current1,2 CKPWRGD_PD#=0 1.3 mA Notes: 1. Guaranteed by design and characterization, not 100% tested in production. 2. Assuming REF is not running in power down state. Electrical Characteristics–Differential Output Duty Cycle, Jitter, and Skew Characterisitics (T A = -40~85 o C; VDD = 3.3V +/- 10%; VDDO = 1.8V +/- 10%, See Test Loads for Loading Conditions) Symbol Parameters Condition Min. Type Max. Units t DC Duty Cycle1 Measured differentially, PLL Mode 45 55 % t sk3 Skew, Output to Output1 V T = 50% 50 ps t jcyc-cyc Jitter, Cycle to cycle1 PLL mode 50 ps Notes: 1. Guaranteed by design and characterization, not 100% tested in production. 2. Measured from differential waveform. Supply Voltage to Ground Potential......................................................4.6V All Inputs and Output.....................................................-0.5V toVDD+0.5V Ambient Operating Temperature........................................... -40 to +85°C Storage Temperature.......................................................... –65°C to +150°C Junction Temperature .......................................................................... 125°C Soldering Temperature.........................................................................260°C ESD Protection (Input) ...........................................................2000V(HBM) Note: Stresses greater than those listed under MAXIMUM RAT- INGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. Maximum Ratings (Above which useful life may be impaired. For user guidelines, not tested.) 15-0072 |
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