MCP8024

DS20005228A-page 12

 2013 Microchip Technology Inc.

Note:

test to an ambient temperature equal to the desired junction temperature. The test time is small enough such that the

rise in Junction temperature over the Ambient temperature is not significant.

FIGURE 2-7: 5V LDO Dynamic Linestep -

FIGURE 2-8: 12V LDO Dynamic Linestep -

FIGURE 2-9: 12V LDO Dynamic Linestep -

FIGURE 2-10: 5V LDO Dynamic Loadstep -

Rising Current.

FIGURE 2-11: 5V LDO Dynamic Loadstep -

Falling Current.

FIGURE 2-12: 12V LDO Dynamic Loadstep -

Rising Current.

-180

-120

-60

0

60

120

180

0

3

6

9

12

15

18

0

50

100

150

200

250

Time (µs)

Vin = 15V

Vin = 14V

Vout (AC)

Cin = Cout = 10 µF

Iout = 20 mA

-140

-70

0

70

140

210

280

0

3

6

9

12

15

18

0

50

100

150

200

250

Time (µs)

Vin = 14V

Vin = 15V

Vout (AC)

Cin = Cout = 10 µF

Iout = 20 mA

-180

-120

-60

0

60

120

180

0

3

6

9

12

15

18

0

50

100

150

200

250

Time (µs)

Vin = 15V

Vin = 14V

Vout (AC)

Cin = Cout = 10 µF

Iout = 20 mA

-40

-30

-20

-10

0

10

20

30

40

0

5

10

15

20

25

Time (ms)

Vout (AC)

Vin = 14V

Vout = 5V

Cin = Cout = 10 µF

Iout = 1 mA to 20 mA Step

-40

-30

-20

-10

0

10

20

30

40

0

5

10

15

20

25

Time (ms)

Vout (AC)

Vin = 14V

Vout = 5V

Cin = Cout = 10 µF

Iout = 20 mA to 1 mA Step

-40

-30

-20

-10

0

10

20

30

40

0

5

10

15

20

25

Time (ms)

Vout (AC)

Vin = 14V

Vout = 12V

Cin = Cout = 10 µF

Iout = 1 mA to 20 mA Step