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DS96F173ME/883 데이터시트(PDF) 4 Page - Texas Instruments

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부품명 DS96F173ME/883
상세설명  DS96F173MQML/DS96F175MQML EIA-485/EIA-422 Quad Differential Receivers
PDF  14 Pages
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제조업체  TI1 [Texas Instruments]
홈페이지  http://www.ti.com
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DS96F173ME/883 데이터시트(HTML) 4 Page - Texas Instruments

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DS96F173MQML, DS96F175MQML
SNOSAS9A – APRIL 2011 – REVISED APRIL 2013
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings
(1)
Storage Temperature Range(TStg)
−65°C ≤ TA ≤ +175°C
Lead Temperature (Soldering, 60 sec.)
300°C
Max. Package Power Dissipation at 25°C(2)
CDIP (NFE)
1,500 mW
CDIP (NAD)
1,034 mW
LCCC (NAJ)
1,500 mW
Supply Voltage
7.0V
Input Voltage, A or B Inputs
±25V
Differential Input Voltage
±25V
Enable Input Voltage
7.0V
Low Level Output Current
50 mA
(1)
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics--DC Parameters. The ensured specifications apply only for the test conditions listed. Some performance
characteristics may degrade when the device is not operated under the listed test conditions.
(2)
Above TA = 25°C derate NFE package 10 mW/°C, NAD package 6.90 mW/°C, NAJ package 11.11 mW/°C.
Recommended Operating Conditions
Min
Max
Units
Supply Voltage (VCC)
4.50
5.50
V
Common Mode Input Voltage (VCM)
−7
+12
V
Differential Input Voltage (VID)
−7
+12
V
Output Current HIGH (IOH)
−400
μA
Output Current LOW (IOL)
16
mA
Operating Temperature (TA)
−55
125
°C
Quality Conformance Inspection
Mil-Std-883, Method 5005 - Group A
Subgroup
Description
Temp (°C)
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
12
Settling time at
+25
13
Settling time at
+125
14
Settling time at
-55
4
Submit Documentation Feedback
Copyright © 2011–2013, Texas Instruments Incorporated
Product Folder Links: DS96F173MQML DS96F175MQML



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