+1.6V to +5.5V

TRIP

TEST

OT

4

1

2

6

Input

Pin

LM26LV

Reset

Sample

GND

SAR Analog-to-Digital Converter

OT

5

3

LM26LV

2

GND

5

OVERTEMP

3

4

1

NC

NC

See text.

100k

NC

6

LM26LV

2

GND

5

OVERTEMP

3

4

1

NC

NC

See text.

6

NC

LM26LV

www.ti.com

SNIS144F – JULY 2007 – REVISED FEBRUARY 2013

Applications Circuits

Figure 23. Temperature Switch Using Push-Pull Output

Figure 24. Temperature Switch Using Open-Drain Output

Figure 25. Suggested Connection to a Sampling Analog-to-Digital Converter Input Stage

Most CMOS ADCs found in microcontrollers and ASICs have a sampled data comparator input structure. When

the ADC charges the sampling cap, it requires instantaneous charge from the output of the analog source such

as the LM26LV/LM26LV-Q1 temperature sensor and many op amps. This requirement is easily accommodated

sampling frequency. Since not all ADCs have identical input stages, the charge requirements will vary. This

general ADC application is shown as an example only.

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