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MCP2551I/P 데이터시트(PDF) 7 Page - Microchip Technology |
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MCP2551I/P 데이터시트(HTML) 7 Page - Microchip Technology |
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7 / 20 page ![]() 2002 Microchip Technology Inc. Preliminary DS21667C-page 7 MCP2551 Absolute Maximum Ratings† VDD.............................................................................................................................................................................7.0V DC Voltage at TXD, RXD, VREF and VS.............................................................................................-0.3V to VDD + 0.3V DC Voltage at CANH, CANL (Note 1).......................................................................................................... -42V to +42V Transient Voltage on Pins 6 and 7 (Note 2)............................................................................................. -250V to +250V Storage temperature ...............................................................................................................................-55°C to +150°C Operating ambient temperature ..............................................................................................................-40°C to +125°C Virtual Junction Temperature, TVJ (Note 3) ............................................................................................-40°C to +150°C Soldering temperature of leads (10 seconds) ....................................................................................................... +300°C ESD protection on CANH and CANL pins (Note 4) ................................................................................................... 6 kV ESD protection on all other pins (Note 4) .................................................................................................................. 4 kV Note 1: Short-circuit applied when TXD is high and low. 2: In accordance with ISO-7637. 3: In accordance with IEC 60747-1. 4: Classification A: Human Body Model. † NOTICE: Stresses above those listed under “Maximum ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. |
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